发明名称 INSPECTION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an inspection apparatus capable of quickly inspecting an internal state of an object to be inspected at low cost. <P>SOLUTION: When a flashlight 3 heats the whole top surface of an object 50 to be inspected, the heat is conducted toward the inside of an upper metal plate, passes through a junction, and is conducted to and diffused in a lower metal plate. Thus, when the distribution of temperatures on the whole top surface of the upper metal plate is measured, an area including the junction therein has a temperature lower than those in other areas. An inspection apparatus 1 specifies an area whose external surface temperature changes more largely than in other areas in the whole top surface of the upper metal plate, measures a width of the specified area, and calculates a nugget diameter. On the basis of the nugget diameter, the inspection apparatus determines whether or not a junction state of the junction is acceptable. Since the object 50 to be inspected does not need to be moved to a controlled area and a supervisor is unnecessary with the inspection apparatus 1, the internal state of the object can be more quickly inspected at lower cost in comparison with X-ray inspection. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012103176(A) 申请公布日期 2012.05.31
申请号 JP20100253292 申请日期 2010.11.11
申请人 TECHNO SYSTEM KK 发明人 TANAKA MIKITO
分类号 G01N25/72 主分类号 G01N25/72
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