发明名称 TEST DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To stabilize power supply voltage when simultaneously measuring a plurality of devices under test. <P>SOLUTION: A test device 2a simultaneously tests a plurality of DUT 1. A common main power supply 10 supplies power to a power supply terminal P1 of the plurality of DUT 1. A power supply compensation circuit 20 includes a switch element which is controlled according to a control signal S<SB POS="POST">CNT</SB>, injects a compensation pulse current I<SB POS="POST">CMP</SB>into the power supply terminals P1 of the plurality of DUT 1, and/or pulls the compensation pulse current I<SB POS="POST">CMP</SB>into a different path from the plurality of DUT 1. For example, a pattern generator PG produces a common test patten S<SB POS="POST">PTN</SB>to the plurality of DUT 1. The pattern generator PG changes a control pattern S<SB POS="POST">PTN_CMP</SB>according to the number of the DUT 1 so as to produce the compensation pulse current I<SB POS="POST">CMP</SB>of amount proportional to the number of the DUT 1 under operation. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012103104(A) 申请公布日期 2012.05.31
申请号 JP20100251810 申请日期 2010.11.10
申请人 ADVANTEST CORP 发明人 ISHIDA MASAHIRO;WATANABE DAISUKE;KAWABATA MASAYUKI;OKAYASU TOSHIYUKI
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址