发明名称 TRANSMISSION ELECTRON MICROSCOPE APPARATUS HAVING ELECTRONIC SPECTROSCOPE, SAMPLE HOLDER, AND METHOD OF ACQUIRING SAMPLE STAGE AND SPECTRAL IMAGE
摘要 <P>PROBLEM TO BE SOLVED: To provide a transmission electron microscope apparatus capable of acquiring a spectral image simultaneously from a plurality of samples and measuring a highly accurate chemical shift form an electronic energy loss spectrum extracted from the spectral image, a sample holder, a sample stage, and a method of acquiring the spectral image. <P>SOLUTION: This transmission electron microscope apparatus 1 includes an electron gun for emitting electron beams 3, a conversion lens 4 for converging the emitted electron beams, a plurality of sample stages to which the converged electron beams are emitted and on which samples 18, 19 are disposed, a sample movement control device for moving the sample stages, an imaging lens 7 for imaging the electron beams transmitted through a plurality of the samples, an electron spectroscope 8 for acquiring the spectral image simultaneously from a plurality of the samples by spectrally diffracting the electron beams by the amount of energy of the imaged electron beams to output the spectral image in which a convergence position on an energy dispersion axis is made different from that in a direction perpendicular to the energy dispersion axis, and an image display device 14 for displaying the acquired spectral images. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012104502(A) 申请公布日期 2012.05.31
申请号 JP20120010590 申请日期 2012.01.23
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 TERADA SHOHEI;TANIGUCHI YOSHIFUMI
分类号 H01J37/26;H01J37/20 主分类号 H01J37/26
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