发明名称 Method for X-ray diffractometer analysis at different wavelengths without changing the x-ray source
摘要 The method involves changing energy-dispersive semiconductor detector for retaining of counting events from an x-ray source (3). An x-ray (6) is controlled by a sample (2) with different characteristic power lines. The x-ray is provided with mixing assembly of an x-ray anode (4). An independent claim is also included for a device for executing analysis method, where a mixing assembly of the x-ray anode has copper, cobalt, chromium, iron and molybdenum.
申请公布号 EP2447710(A3) 申请公布日期 2012.05.30
申请号 EP20110186560 申请日期 2011.10.25
申请人 BRUKER AXS GMBH 发明人 SCHIPPER, ROLF;LANGE, JOACHIM
分类号 G01N23/20;H01J35/10 主分类号 G01N23/20
代理机构 代理人
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