发明名称 Surface evaluation employing orthogonal force measurement
摘要 A method for evaluating a performance of a substrate surface including applying a normal force with a probe to a surface of a substrate, the normal force being substantially perpendicular to the surface, and moving the probe across the surface to generate a force against and to scratch the surface, the force being substantially parallel to the surface and comprising a coaxial force along the scratch and an orthogonal force perpendicular to the scratch. The method further includes measuring a magnitude of the orthogonal force as the probe moves across the coating, and determining a fracture point of the surface by the probe based on changes in the magnitude of the orthogonal force.
申请公布号 US8186210(B2) 申请公布日期 2012.05.29
申请号 US20090471036 申请日期 2009.05.22
申请人 HANGEN UDE DIRK;HYSITRON INCORPORATED 发明人 HANGEN UDE DIRK
分类号 G01N17/00 主分类号 G01N17/00
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