| 摘要 |
Embodiments of the present invention provide a method/apparatus to measure the jitter of a timing signal used in an integrated circuit chip. The method/apparatus is used to send data from a launch element using a synchronous data path of the timing signal, receive the data at a capture element using the synchronous data path, wherein the launch element and the capture element are disposed on the same integrated circuit chip upon which the timing signal is generated and/or used, and gather statistics about whether a timing violation has occurred by comparing the sent data with the received data over the course of multiple launch/capture events as the timing is adjusted. Other embodiments may be described and/or claimed. |
