发明名称 Semiconductor memory device
摘要 The present invention aims at providing a semiconductor memory device that can be manufactured by a MOS process and can realize a stable operation. A storage transistor has impurity diffusion regions, a channel formation region, a charge accumulation node, a gate oxide film, and a gate electrode. The gate electrode is connected to a gate line and the impurity diffusion region is connected to a source line. The storage transistor creates a state where holes are accumulated in the charge accumulation node and a state where the holes are not accumulated in the charge accumulation node to thereby store data “1” and data “0”, respectively. An access transistor has impurity diffusion regions, a channel formation region, a gate oxide film, and a gate electrode. The impurity diffusion region is connected to a bit line.
申请公布号 US8188534(B2) 申请公布日期 2012.05.29
申请号 US201113022864 申请日期 2011.02.08
申请人 MORISHITA FUKASHI;ARIMOTO KAZUTAMI;RENESAS ELECTRONICS CORPORATION 发明人 MORISHITA FUKASHI;ARIMOTO KAZUTAMI
分类号 H01L29/788;G11C11/405;H01L21/8242;H01L27/01;H01L27/108;H01L27/12 主分类号 H01L29/788
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