| 摘要 |
Methods for program verifying, program verify circuits, and memory devices are disclosed. One such method for program verifying includes generating a ramped voltage for a plurality of count values. The ramped voltage is applied to a control gate of a memory cell being program verified. At least a portion of each count value is compared to an indication of a target threshold voltage for the memory cell. When the at least a portion of the count value is equal to the indication of the target threshold voltage indication, sense circuitry is used to check if the memory cell has been activated by the voltage generated by the count. If the memory cell has been activated, an inhibit latch is set to inhibit further programming of the memory cell. If the memory cell has not been activated by the voltage, the memory cell is biased with another programming pulse. |
