发明名称 SUBSTRATE SUPPORT HAVING DYNAMIC TEMPERATURE CONTROL
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate support having dynamic temperature control ability during plasma processing of a substrate. <P>SOLUTION: A substrate support 40 useful for a plasma processing apparatus includes a metallic heat transfer member 48 and an overlying electrostatic chuck 50 having a substrate support surface. The heat transfer member 48 includes one or more passages through which a liquid is circulated to heat and/or cool the heat transfer member 48. The heat transfer member has a low thermal mass and can be rapidly heated and/or cooled to a desired temperature by the liquid, so as to rapidly change the substrate temperature during plasma processing. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012099825(A) 申请公布日期 2012.05.24
申请号 JP20110259478 申请日期 2011.11.28
申请人 LAM RESEARCH CORPORATION 发明人 STEGER ROBERT J
分类号 H01L21/683;C23C16/00;C23C16/458;H01L;H01L21/00;H01L21/205;H01L21/3065;H02N13/00 主分类号 H01L21/683
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