发明名称 IMPACT TEST APPARATUS FOR CIRCUIT BOARD, IMPACT TEST METHOD FOR CIRCUIT BOARD, ACTUATOR HAMMER AND COMPUTER PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To solve problems such as an impact lack in the case of depending on manual operation or a damage accident caused by excessive impact by enabling stable tapping without depending on manual operation in an impact test for a circuit board and the like. <P>SOLUTION: An impact test apparatus includes a control device 10 and a test device 20. An operation determination section 12 of the control device 10 determines an operation situation of the test device 20, a hammer driving section 13 controls operation of an actuator hammer 100, a setting input section 14 inputs an impact strength or automatic/manual setting, and a display section 16 displays inputted data or a determination result of operation. The test device 20 includes the actuator hammer 100 which generates an actual impact power or the like, a connecting cable 101 which connects the hammer with the control device 10, function test software 23 which monitors operation of the test device 20, and a USB cable 21 which connects the function test software 23 and the control device 10. A USB connection section 11 connects the control device 10 and the test device 20. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012098145(A) 申请公布日期 2012.05.24
申请号 JP20100245960 申请日期 2010.11.02
申请人 NEC FIELDING LTD 发明人 TAMAI KAORU
分类号 G01M7/02;G01N3/32 主分类号 G01M7/02
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