发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>Disclosed is a semiconductor device which is provided with: a first gate electrode (125) that has a relatively large width in the gate length direction and a second gate electrode (126) that has a relatively small width in the gate length direction, said gate electrodes being formed on a p-type well (102) and extending parallel to each other; an LDD low concentration region (135) that is formed in the p-type well (102) between the first gate electrode (125) and the second gate electrode (126); and LDD medium concentration regions (134) that are formed in the p-type well (102) respectively at positions outside the first gate electrode (125) and the second gate electrode (126). The impurity concentration of the LDD low concentration region (135) is lower than the impurity concentration of the LDD medium concentration regions (134).</p> |
申请公布号 |
WO2012066695(A1) |
申请公布日期 |
2012.05.24 |
申请号 |
WO2011JP02597 |
申请日期 |
2011.05.10 |
申请人 |
PANASONIC CORPORATION;KANEGAE, KENSHI |
发明人 |
KANEGAE, KENSHI |
分类号 |
H01L21/336;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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