| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a light distribution property measuring device, light distribution property inspection device, light distribution property measuring program, light distribution property measuring method and light distribution property inspection method in which a light distribution property of a light source that becomes a measuring target or an inspection target is instantaneously measured or determined to fast inspect the light source in a production line and to accurately measure a radiation intensity of the light source that may change with the passage of time. <P>SOLUTION: A light distribution property measuring device 100 includes a hemispherical diffusion panel 30 which is formed in a hemispherical shape so as to cover a light source 10 and disposed in such a manner that an apex of the hemisphere matches a central axis of the light source 10, an imaging apparatus 50 which images light radiated from the light source 10 and transmitted through the hemispherical diffusion panel 30, vertical light intensity extraction means 61 which extracts an X-axis vertical light intensity and a Y-axis vertical light intensity, and radiation strength calculation means 63 which converts the X-axis vertical light intensity and the Y-axis vertical light intensity into an X-axis cross-sectional radiation strength and a Y-axis cross-sectional radiation strength. <P>COPYRIGHT: (C)2012,JPO&INPIT |
