| 摘要 |
<p>[Problem] To provide a surface plasmon excitation enhancement fluorescence measurement device, a sensor structure used therefor, and an auxiliary dielectric member provided to the sensor structure which are capable of optically correcting an attachment error and the like of a light source at the time of an installation or a maintenance of an SPFS device and capable of highly maintaining fluorescence detection accuracy while making it possible to prevent an increase in size of the sensor structure to reduce the cost of the sensor structure and improve handleability thereof. [Solution] A sensor structure is used for a surface plasmon excitation enhancement fluorescence measurement device in which a metal thin film formed on an upper surface of a dielectric member is irradiated with excitation light at an incident angle (?a) as a total reflection condition from the side of the dielectric member, and an electric field on the metal thin film is enhanced, thereby exciting fluorescent substances in a ligand-containing layer formed on the metal thin film, with the result that the fluorescence enhanced is detected by a light detection means, the sensor structure being constituted of at least a main dielectric member, the metal thin film formed on the upper surface of the main dielectric member, and the ligand-containing layer formed on the upper surface of the metal thin film, in which the main dielectric member has a junction surface, a lower surface of which can be optically joined with an auxiliary dielectric member.</p> |
