发明名称 Method and measuring assembly for wavelength modulation spectroscopy
摘要 <p>The method involves using laser light emitted by laser light source (2) into two beams (3,4) as analysis and reference laser beams. The analysis measurement detector (7) or reference measurement detector (9) are provided for detecting respective laser beams passing through to-be-analyzed gas (6). The noise caused by self-mixing effects of demodulated detector signal analysis is reduced by difference of demodulated output signals. The frequency modulated laser light is generated from light source based on nf signal analysis of detector, where n is a positive integer and f is frequency. An independent claim is included for measuring arrangement for performing wavelength modulation spectroscopy.</p>
申请公布号 EP2455733(A1) 申请公布日期 2012.05.23
申请号 EP20100014737 申请日期 2010.11.18
申请人 LEISTER PROCESS TECHNOLOGIES 发明人 WILLING, BERT;GAILLARD, MATHIEU;WITTMANN, ANDREAS
分类号 G01J3/433 主分类号 G01J3/433
代理机构 代理人
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