发明名称 |
Eddy current testing device |
摘要 |
An eddy current testing device which confirms that a change in characteristics of a target object is detected regardless of the magnitude of the change and specifying the position of a portion from which the change is detected. The device uses an eddy current probe to inspect a bent portion of a metal body, and has an inspection controller and a display unit. The inspection controller calculates a phase angle of a signal detected by the eddy current probe and generates flaw identification image data that indicates an area (or an area of the signal detected and determined to correspond to a flaw signal, based on the phase angle of the detected signal) of a flaw signal in coordinates in which the position of the portion of the target object is plotted along a coordinate axis. The display unit displays the flaw identification image data. |
申请公布号 |
US8183862(B2) |
申请公布日期 |
2012.05.22 |
申请号 |
US20090389499 |
申请日期 |
2009.02.20 |
申请人 |
ENDO HISASHI;NISHIMIZU AKIRA;OUCHI HIROFUMI;NONAKA YOSHIO;HITACHI, LTD. |
发明人 |
ENDO HISASHI;NISHIMIZU AKIRA;OUCHI HIROFUMI;NONAKA YOSHIO |
分类号 |
G01N27/82 |
主分类号 |
G01N27/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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