发明名称 Method for fabricating MOS transistor
摘要 The invention discloses a method for fabricating a MOS transistor. A substrate having thereon a gate structure is provided. A silicon nitride layer is deposited on the gate structure. A dry etching process is then performed to define a silicon nitride spacer on each sidewall of the gate structure and a recess in a source/drain region on each side of the gate structure. A transitional layer covering the gate structure and the recess is deposited. A pre-epitaxial clean process is performed to remove the transitional layer. The substrate is subjected to a pre-bake process. An epitaxial growth process is performed to grow an embedded SiGe layer in the recess. The disposable silicon nitride spacer is removed.
申请公布号 US8183118(B2) 申请公布日期 2012.05.22
申请号 US20100868739 申请日期 2010.08.26
申请人 LU TSUO-WEN;HSIAO TSAI-FU;WANG YU-REN;CHAN SHU-YEN;UNITED MICROELECTRONICS CORP. 发明人 LU TSUO-WEN;HSIAO TSAI-FU;WANG YU-REN;CHAN SHU-YEN
分类号 H01L21/336 主分类号 H01L21/336
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