发明名称 Error recovery within processing stages of an integrated circuit
摘要 An integrated circuit includes a plurality of processing stages each including processing logic, a non-delayed signal-capture element, a delayed signal-capture element and a comparator. The non-delayed signal-capture element captures an output from the processing logic at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element also captures a value from the processing logic. An error detection circuit and error correction circuit detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator. The comparator compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.
申请公布号 US8185786(B2) 申请公布日期 2012.05.22
申请号 US20100923911 申请日期 2010.10.13
申请人 FLAUTNER KRISZTIAN;AUSTIN TODD MICHAEL;BLAAUW DAVID THEODORE;MUDGE TREVOR NIGEL;ARM LIMITED;THE REGENTS OF THE UNIVERSITY OF MICHIGAN 发明人 FLAUTNER KRISZTIAN;AUSTIN TODD MICHAEL;BLAAUW DAVID THEODORE;MUDGE TREVOR NIGEL
分类号 G06F11/00 主分类号 G06F11/00
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