Single event upset error detection within an integrated circuit

摘要

An integrated circuit 2 includes logic circuitry 10 and sequential storage elements 8. Both the logic circuit 10 and sequential storage elements 8 can be subject to particle strikes giving rise to single event upset errors. These single event upset errors can be detected by detecting a transition in the stored value stored by the sequential storage elements 8 occurring outside of a valid transition period associated with that sequential storage element 8.