发明名称 Method and apparatus for characterizing properties of electronic devices depending on device parameters
摘要 A system and method for obtaining information about an electronic device includes the steps of providing a criterion for a property of the electronic device depending on at least one device parameter, and determining a relationship between variations of the at least one device parameter and variations of the property.
申请公布号 US8185369(B2) 申请公布日期 2012.05.22
申请号 US20070650649 申请日期 2007.01.08
申请人 HAEUSSLER ROBERT;KINZELBACH HARALD;LANG ALFRED;INFINEON TECHNOLOGIES AG 发明人 HAEUSSLER ROBERT;KINZELBACH HARALD;LANG ALFRED
分类号 G06F17/50;G06F9/455 主分类号 G06F17/50
代理机构 代理人
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