发明名称 |
Method and apparatus for characterizing properties of electronic devices depending on device parameters |
摘要 |
A system and method for obtaining information about an electronic device includes the steps of providing a criterion for a property of the electronic device depending on at least one device parameter, and determining a relationship between variations of the at least one device parameter and variations of the property. |
申请公布号 |
US8185369(B2) |
申请公布日期 |
2012.05.22 |
申请号 |
US20070650649 |
申请日期 |
2007.01.08 |
申请人 |
HAEUSSLER ROBERT;KINZELBACH HARALD;LANG ALFRED;INFINEON TECHNOLOGIES AG |
发明人 |
HAEUSSLER ROBERT;KINZELBACH HARALD;LANG ALFRED |
分类号 |
G06F17/50;G06F9/455 |
主分类号 |
G06F17/50 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|