发明名称 RESISTANCE CHANGE MEMORY DEVICE, AND RESISTANCE CHANGE MEMORY DEVICE CROSS POINT ARRAY
摘要 <p>PURPOSE: A resistance change memory device and a resistance change memory device cross point array are provided to program data without interference between cells. CONSTITUTION: A node is arranged between a top electrode(50) and a bottom electrode(10). A bottom variable resistor is connected to the bottom electrode and the node. A top variable resistor is connected to the top electrode and the node. Any one among the variable resistors is set to a low resistance in a first positive electric field between the top electrode and the bottom electrode and is set to a high resistance in a first negative electric field between the top electrode and the bottom electrode. Another variable resistor is set to a low resistance in a second negative electric field between the top electrode and the bottom electrode and is set to a high resistance in a second positive electric field between the top electrode and the bottom electrode.</p>
申请公布号 KR20120050870(A) 申请公布日期 2012.05.21
申请号 KR20100112331 申请日期 2010.11.11
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 LEE, JOON MYOUNG;HWANG, HYUN SANG
分类号 G11C13/00;G11C16/20;G11C16/30;H01L27/115 主分类号 G11C13/00
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