发明名称 Probe for inspection of edges of a structure
摘要 An apparatus including a linear array transducer coupled to an upper housing of the apparatus and positioned above a tapered chamber. The tapered chamber configured to maintain a column of couplant between the linear array transducer and a structure to be inspected as the linear array transducer is positioned over an edge of the structure.
申请公布号 KR101144470(B1) 申请公布日期 2012.05.21
申请号 KR20097014253 申请日期 2008.02.27
申请人 发明人
分类号 G01N29/28;G01N29/22;G01N29/24;G01N29/265 主分类号 G01N29/28
代理机构 代理人
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