发明名称 PROBE AND PROBE MANUFACTURING METHOD
摘要 PURPOSE: A probe and a probe manufacturing method are provided to reduce a width of a bonding pad by performing junction with fused solder in a probe. CONSTITUTION: A tip portion(101) is touched with a target object. A probe body(110) elastically supports the tip portion. The probe body has a plate shaped bonding portion(113) on a lower portion. A first solder portion is formed by being buried and while being exposed to one side of the bonding portion. The first solder portion is fused to attach the probe body to a circuit board.
申请公布号 KR20120050193(A) 申请公布日期 2012.05.18
申请号 KR20100111581 申请日期 2010.11.10
申请人 KOREA INSTRUMENT CO., LTD. 发明人 KIM, HYEONG TAE
分类号 H01L21/66 主分类号 H01L21/66
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