发明名称 ELECTRICAL CHARACTERISTICS MEASURING DEVICE FOR DIELECTRIC MATERIAL
摘要 <P>PROBLEM TO BE SOLVED: To facilitate development/selection of a dielectric material used in a millimeter wave wireless device capable of measuring electrical characteristics of a dielectric material such as a dielectric constant and magnetic permeability at a millimeter wave band within a wide temperature range and used under an environment where a temperature greatly changed. <P>SOLUTION: An electrical characteristics measuring device for a dielectric material includes to two electromagnetic horns 101 and 102 having beam lenses 107 and 108 and arranged to match focuses, and measures electrical characteristics of the dielectric material by measuring transmission characteristics at a millimeter wave band of a plate dielectric material sample 106 placed on the focal position. A hermetically sealed space 14 including therein the sample 106 is formed by a seal 2 detachable from a case 1 and an opening formed in the case 1, gas controlled for temperature by a heating/cooling device 3 capable of variably controlling the temperature is distributed into the hermetically sealed space 14 to set the temperature of the sample 106 as a target temperature, and the electrical characteristics of the sample are measured at the target temperature. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012093223(A) 申请公布日期 2012.05.17
申请号 JP20100240834 申请日期 2010.10.27
申请人 KANTOH ELECTRONICS APPLICATION & DEVELOPMENT INC 发明人 TAWARA TAKESHI
分类号 G01N22/00;G01R27/26;G01R27/28 主分类号 G01N22/00
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