发明名称 DEPOSITION METHOD FOR SILICON OXIDE FILM AND MANUFACTURING METHOD FOR SILICON EPITAXIAL WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a deposition method for a silicon oxide film by a chemical vapor deposition (CVD) method, which can form a silicon oxide containing fewer OH groups without performing extra modification process such as thermal treatment or chlorine processing after the deposition of the silicon oxide film. <P>SOLUTION: According to a method for depositing a silicon oxide film on a silicon wafer for epitaxial growth by a CVD method, the silicon oxide film is formed by the CVD method under a reaction gas atmosphere containing chlorine gas in addition to silicon source gas on a silicon wafer prior to the growth of an epitaxial layer on its surface. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012094615(A) 申请公布日期 2012.05.17
申请号 JP20100239361 申请日期 2010.10.26
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 SHIBATA YUKI
分类号 H01L21/205;H01L21/316 主分类号 H01L21/205
代理机构 代理人
主权项
地址