发明名称 SEMICONDUCTOR APPARATUS AND FABRICATING METHOD THEREOF
摘要 A semiconductor apparatus includes a semiconductor chip formed on a predetermined area of a wafer, wafer test block formed on an area outside the predetermined area, and signal line for electrically connecting the semiconductor chip to the wafer test block. Through-silicon via is formed to vertically penetrate the signal line.
申请公布号 US2012119208(A1) 申请公布日期 2012.05.17
申请号 US201113181802 申请日期 2011.07.13
申请人 SHIN SANG HOON;HYNIX SEMICONDUCTOR INC. 发明人 SHIN SANG HOON
分类号 H01L23/544;H01L21/28;H01L23/48 主分类号 H01L23/544
代理机构 代理人
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