发明名称 SELF-SERVICE CIRCUIT TESTING SYSTEMS AND METHODS
摘要 In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.
申请公布号 US2012123727(A1) 申请公布日期 2012.05.17
申请号 US201113332913 申请日期 2011.12.21
申请人 WANG YIMING;ADELSON LAUREN B.;BUIE DAVID J.;DAVIS COLLEEN;SERUBO PETER C.;ZITO-WOLF ROLAND J.;VERIZON BUSINESS FINANCIAL MANAGMENT CORPORATION;VERIZON DATA SERVICES INC.;VERIZON SERVICES CORP. 发明人 WANG YIMING;ADELSON LAUREN B.;BUIE DAVID J.;DAVIS COLLEEN;SERUBO PETER C.;ZITO-WOLF ROLAND J.
分类号 G06F19/00;G01R31/28 主分类号 G06F19/00
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