发明名称 Methods for linewidth modification and apparatus implementing the same
摘要 A linear-shaped core structure of a first material is formed on an underlying material. A layer of a second material is conformally deposited over the linear-shaped core structure and exposed portions of the underlying material. The layer of the second material is etched so as to leave a filament of the second material on each sidewall of the linear-shaped core structure, and so as to remove the second material from the underlying material. The linear-shaped core structure of the first material is removed so as to leave each filament of the second material on the underlying material. Each filament of the second material provides a mask for etching the underlying material. Each filament of the second material can be selectively etched further to adjust its size, and to correspondingly adjust a size of a feature to be formed in the underlying material.
申请公布号 US2012118854(A1) 申请公布日期 2012.05.17
申请号 US201113373470 申请日期 2011.11.14
申请人 SMAYLING MICHAEL C.;BECKER SCOTT T.;TELA INNOVATIONS, INC. 发明人 SMAYLING MICHAEL C.;BECKER SCOTT T.
分类号 C23F1/02 主分类号 C23F1/02
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