发明名称 Method and System of Improved Reliability Testing
摘要 A method and system of improved reliability testing includes providing a first substrate and a second substrate, each substrate comprising only a first metallization layer; processing regions on a first substrate by combinatorially varying at least one of materials, unit processes, and process sequences; performing a first reliability test on the processed regions on the first substrate to generate first results; processing regions on a second substrate in a combinatorial manner by varying at least one of materials, unit processes, and process sequences based on the first results of the first reliability test; performing a second reliability test on the processed regions on the second substrate to generate second results; and determining whether the first substrate and the second substrate meet a predetermined quality threshold based on the second results.
申请公布号 US2012119768(A1) 申请公布日期 2012.05.17
申请号 US20100948257 申请日期 2010.11.17
申请人 WANG YUN;CHIANG TONY P.;CLARKE RYAN;LANG CHI-I;SCHWARZ YORAM 发明人 WANG YUN;CHIANG TONY P.;CLARKE RYAN;LANG CHI-I;SCHWARZ YORAM
分类号 G01R31/3187;H01L21/66 主分类号 G01R31/3187
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