| 摘要 |
<P>PROBLEM TO BE SOLVED: To suppress optical adverse effects of surface properties on facing surfaces of a microchip and an optical member. <P>SOLUTION: The analysis system comprises: a microchip 1 including a space which houses a sample or through which the sample passes, at the inside of the microchip 1; and an optical member 6 for guiding incident light to the space 5 inside of the microchip 1 or emission light from the space. Filler 4 having a refractive index approximate to the refractive index of either one of the optical member 6 and the microchip 1 is provided between the optical member 6 and an incidence surface for the incident light or an emission surface for the emission light in the microchip 1. <P>COPYRIGHT: (C)2012,JPO&INPIT |
