| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor circuit, a semiconductor device, a failure diagnosis method, and a failure diagnosis program, capable of self-diagnosing the failure of the switch of a selection circuit. <P>SOLUTION: To diagnose the failure of the high potential side SW of a cell selection SW 20, a low potential side SW and the high potential side SW are all turned OFF (in all OFF-state) to detect an output voltage Vout. In the case of output voltage Vout=0 V, no failure on the high potential side SW is determined. In the case of output voltage Vout≠0 V, a failure on the high potential side SW is determined. To diagnose a failure on the low potential side SW, a test switch TSW5 is turned ON in the all OFF-state, and a voltage VREF is supplied from a voltage supply unit 24 to a wire 25 to determine an output voltage Vout. In the case of output voltage Vout=1/2 VREF, no failure on the low potential side SW is determined. In the case of output voltage Vout≠1/2 VREF, a failure on the low potential side SW is determined. <P>COPYRIGHT: (C)2012,JPO&INPIT |
