发明名称 FIELD-EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem that an insulating film covering a region from a gate electrode to a source and a drain is a factor of increased parasitic capacitance. <P>SOLUTION: A gate electrode is formed on a substrate having a semiconductor layer. A source electrode and a drain electrode are oppositely formed on the semiconductor layer so as to be spaced apart from the gate electrode. A gate side insulating film, which is disposed apart from the source electrode and the drain electrode, is formed on the semiconductor layer between the source electrode and the drain electrode. The gate side insulating film has an opening for a gate in which the bottom of the gate electrode is filled. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012094726(A) 申请公布日期 2012.05.17
申请号 JP20100241619 申请日期 2010.10.28
申请人 FUJITSU LTD 发明人 MAKIYAMA KOZO
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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