ELECTROMAGNETIC WAVE IMAGING APPARATUS

摘要

A first optical system irradiates a target with a detecting wave and making the detecting wave that is transmitted through the target incident upon the electrooptical crystal. A second optical system slants a pulse plane of a probe wave relative to a pulse plane of the detecting wave and making the probe wave incident upon the electrooptical crystal. A camera detects the probe wave passing through the electrooptical crystal. The first or second optical system includes a compensating component which partitions a beam cross section of the detecting wave or the probe wave into unit areas. The optical component makes different an optical path length of a beam passing each unit area and compensates a phase shifting between the pulse plane of the detecting wave and the pulse plane of the probe wave at positions in a crossing direction of a surface of the electrooptical crystal and the virtual plane.