| 摘要 |
<p>A program circuit (1) activates a pass signal (PASZ) when a first program unit (FS) is programmed. The first program unit (FS) is programmed when a test of an internal circuit (4) is passed. A mode setting circuit (2) switches an operation mode to a normal operation mode or a test mode by external control. A state machine (3) allows a partial circuit (4a) of the internal circuit (4) to perform an unusual operation different from a normal operation when the pass signal (PASZ) is inactivated during the normal operation mode. By recognizing the unusual operation during the normal operation mode, it can be easily recognized that a semiconductor integrated circuit is bad. Since a failure can be recognized without shifting to the test mode, for example, a user who purchases the semiconductor integrated circuit can also easily recognize the failure.</p> |
