发明名称 Negative resist composition and patterning process
摘要 A negative resist composition comprises at least: (A) a base polymer that is alkaline-soluble and is made alkaline-insoluble by action of an acid; (B) an acid generator; and (C) a basic component, wherein the base polymer at least contains a polymer including repeating units represented by the following general formula (1) and general formula (2) and having a weight average molecular weight of 1,000 to 10,000. There can be a negative resist composition hardly causing a bridge in forming a pattern and providing a high resolution and a patterning process using the same.
申请公布号 EP2333610(B1) 申请公布日期 2012.05.16
申请号 EP20100015194 申请日期 2010.12.01
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 TANAKA, AKINOBU;MASUNAGA, KEIICHI;DOMON, DAISUKE;WATANABE, SATOSHI
分类号 G03F7/038;C08F212/04;C08F220/16;G03F7/004;H01L21/027 主分类号 G03F7/038
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