发明名称 Optoelectronic memory device and method for manufacturing and measuring the same
摘要 The present invention provides an optoelectronic memory device, the method for manufacturing and evaluating the same. The optoelectronic memory device according to the present invention includes a substrate, an insulation layer, an active layer, source electrode and drain electrode. The substrate includes a gate, and the insulation layer is formed on the substrate. The active layer is formed on the insulation layer, and more particularly, the active layer is formed of a composite material comprising conjugated conductive polymers and quantum dots. Moreover, both of the source and the drain are formed on the insulation layer, and electrically connected to the active layer.
申请公布号 US8178866(B2) 申请公布日期 2012.05.15
申请号 US20090484606 申请日期 2009.06.15
申请人 WEI KUNG-HWA;SHEU JENG-TZONG;CHEN CHEN-CHIA;CHIU MAO-YUAN;NATIONAL CHIAO TUNG UNIVERSITY 发明人 WEI KUNG-HWA;SHEU JENG-TZONG;CHEN CHEN-CHIA;CHIU MAO-YUAN
分类号 H01L29/08 主分类号 H01L29/08
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