发明名称 CMP PAD CONDITIONER AND METHOD FOR PRODUCING THE SAME
摘要 PURPOSE: A chemical mechanical polishing pad conditioner and a manufacturing method thereof are provided to maximize lifetime of the conditioner by controlling the rate of wear of a cutting tip and to expand the time in which a pad illumination is maintained. CONSTITUTION: A plurality of cutting tips is separately formed on a substrate. The plurality of cutting tips is projected from the substrate toward upper side. The upper side of the cutting tip is parallel to the substrate. The cutting tip comprises a protrusion part and a cutting part. The cutting part is extended from the protrusion part. An area of the upper side of the cutting tip is 25um^2-10000um^2. Pad illumination is maintained to 2 to 10um in the conditioning process.
申请公布号 KR101144981(B1) 申请公布日期 2012.05.11
申请号 KR20110046305 申请日期 2011.05.17
申请人 SAMSUNG ELECTRONICS CO., LTD.;EHWA DIAMOND IND. CO., LTD. 发明人 LEE, SEH KWANG;KIM, YOUN CHUL;LEE, JOO HAN;CHOI, JAE KWANG;BOO, JAE PHIL
分类号 H01L21/304 主分类号 H01L21/304
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