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发明名称
Thin Film Material Testing Apparatus and method for the same
摘要
申请公布号
KR101144797(B1)
申请公布日期
2012.05.11
申请号
KR20050031006
申请日期
2005.04.14
申请人
发明人
分类号
G01B11/16
主分类号
G01B11/16
代理机构
代理人
主权项
地址
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