发明名称 |
POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a positive resist composition capable of reducing the influence from other resist compositions after forming patterns and to provide a method for forming a resist pattern. <P>SOLUTION: A positive resist composition comprises: a base component (A) whose solubility to an alkali developer is increased by the action of an acid; and an acid generator component (B) which generates an acid upon exposure to light. The base component (A) contains a resin component having a constitutional unit (a0-1) derived from an acrylic acid ester which contains an amide group and a protective group which may be eliminated by substituting with a hydroxyl group or an amino group and has no cyclic skeletons in the structure, a constitutional unit (a0-2) derived from an acrylic acid ester which contains a primary or secondary hydroxyl group or a primary or secondary amino group and has no cyclic skeletons in the structure and a constitutional unit (a1) derived from an acrylic acid ester which contains an acid dissociable dissolution-inhibiting group. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012088448(A) |
申请公布日期 |
2012.05.10 |
申请号 |
JP20100233843 |
申请日期 |
2010.10.18 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
DAZAI NAOHIRO;SHIONO HIROHISA |
分类号 |
G03F7/039;C08F20/36;G03F7/004;G03F7/40;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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