发明名称 POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition capable of reducing the influence from other resist compositions after forming patterns and to provide a method for forming a resist pattern. <P>SOLUTION: A positive resist composition comprises: a base component (A) whose solubility to an alkali developer is increased by the action of an acid; and an acid generator component (B) which generates an acid upon exposure to light. The base component (A) contains a resin component having a constitutional unit (a0-1) derived from an acrylic acid ester which contains an amide group and a protective group which may be eliminated by substituting with a hydroxyl group or an amino group and has no cyclic skeletons in the structure, a constitutional unit (a0-2) derived from an acrylic acid ester which contains a primary or secondary hydroxyl group or a primary or secondary amino group and has no cyclic skeletons in the structure and a constitutional unit (a1) derived from an acrylic acid ester which contains an acid dissociable dissolution-inhibiting group. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012088448(A) 申请公布日期 2012.05.10
申请号 JP20100233843 申请日期 2010.10.18
申请人 TOKYO OHKA KOGYO CO LTD 发明人 DAZAI NAOHIRO;SHIONO HIROHISA
分类号 G03F7/039;C08F20/36;G03F7/004;G03F7/40;H01L21/027 主分类号 G03F7/039
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