发明名称 METHOD OF FABRICATING GATE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
摘要 A method of fabricating a gate includes sequentially forming an insulation layer and a conductive layer on substantially an entire surface of a substrate. The substrate has a device isolation layer therein and a top surface of the device isolation layer is higher than a top surface of the substrate. The method includes planarizing a top surface of the conductive layer and forming a gate electrode by patterning the insulation layer and the conductive layer.
申请公布号 US2012115298(A1) 申请公布日期 2012.05.10
申请号 US201113238330 申请日期 2011.09.21
申请人 KIM JONG-PIL;JANG YOUNG-GOAN;KIM DONG-WON;CHO HAG-JU 发明人 KIM JONG-PIL;JANG YOUNG-GOAN;KIM DONG-WON;CHO HAG-JU
分类号 H01L21/28;H01L21/336 主分类号 H01L21/28
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