APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC MEASUREMENT SYSTEM

摘要

The present invention relates to an interferometric system which includes a polarization separation means (10), a first polarization conversion means (11), a Mach-Zehnder interferometer (2) including a first (4) and second (5) arm connected to one another by a first (6) and second (7) end in order for a first and second beam (20, 21) having the same polarization to pass through the interferometer in a reciprocal manner in opposite directions of propagation, respectively, so as to form a first and second interferometric beam (22, 23), a second polarization conversion means (11) for obtaining an interferometric beam (24), the polarization of which is converted, a polarization-combining means (10), and a detection means (8) suitable for detecting an output beam (25).