发明名称 |
PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING PATTERN, MEMS STRUCTURE, METHOD FOR PRODUCING THE STRUCTURE, METHOD FOR DRY ETCHING, METHOD FOR WET ETCHING, MEMS SHUTTER DEVICE, AND IMAGE DISPLAY APPARATUS |
摘要 |
<p>PURPOSE: Photo-sensitive compositions, a method for manufacturing patterns, the structure of microelectromechanical systems(MEMS), a method for manufacturing the structure, a dry etching method, a wet etching method, and MEMS shutter devices, and image display devices are provided to form rectangular profiles or almost rectangular profiles after patterns are baked. CONSTITUTION: Photo-sensitive compositions for etching resist include polymers, photo acid generators, and solvents. The polymers include a first monomer unit and a second monomer unit. The first monomer unit includes a residue in which carboxyl groups or phenolic groups are protected by acid decomposable groups. The second monomer unit includes epoxy group and/or ocetanyl group. The photo-sensitive compositions form a section shape of 70 degrees or more of a tapered angle after a baking process for baking patterns(12). The average molecular weight of the polymers is more than or equal to 20,000. The photo-sensitive compositions include heat cross-linkers.</p> |
申请公布号 |
KR20120046700(A) |
申请公布日期 |
2012.05.10 |
申请号 |
KR20110112904 |
申请日期 |
2011.11.01 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
YONEZAWA HIROYUKI;SHIMONO KATSUHIRO |
分类号 |
G03F7/039;G03F7/004;G03F7/26;G03F7/40 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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