发明名称 FACILITY STATE MONITORING METHOD, APPARATUS THEREFOR AND FACILITY STATE MONITORING PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem that, in abnormality sign detection in a facility of a plant or the like, it is difficult to make easiness in comprehending the basis of abnormality determination by abnormality detection providing a monitor criterion for each sensor compatible with high-sensitivity abnormality detection based on a statistical normality model. <P>SOLUTION: In a method of monitoring a facility state on the basis of time-series sensor signals outputted from sensors mounted in a facility or a device and indicating states of the facility or the device and an event signal of the facility or the device, the sensor signals and the event signal are stored, abnormality is detected by statistically analyzing the stored sensor signals and event signal, learning data are selected on the basis of a result of detecting abnormality, a rule for identifying abnormality is extracted on the basis of the selected learning data, and the rule for identifying abnormality is applied to the sensor signals to perform rule-based abnormality identification, thereby detecting or predicting abnormality in the facility or the device. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012089057(A) 申请公布日期 2012.05.10
申请号 JP20100237310 申请日期 2010.10.22
申请人 HITACHI ENGINEERING & SERVICES CO LTD 发明人 SHIBUYA HISAE;MAEDA SHUNJI
分类号 G05B23/02 主分类号 G05B23/02
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