发明名称 |
IC CURRENT MEASURING APPARATUS AND IC CURRENT MEASURING ADAPTER |
摘要 |
Provided is an IC current measuring apparatus provided between an IC and a substrate. The IC current measuring apparatus electrically connects each of a plurality of IC-facing terminals and a different one of a plurality of substrate-facing terminals. Especially, resistances are each inserted into a path between an IC terminal targeted for measurement and a substrate terminal corresponding thereto. Furthermore, the IC current measuring apparatus is provided with terminals each used to measure a voltage between both ends of an inserted resistance corresponding thereto. Accordingly, a measurer who measures current flowing through an IC-facing terminal can measure the current flowing through the IC-facing terminal by providing the IC current measuring apparatus between the IC targeted for measurement and the substrate and measuring a voltage between both ends of an inserted resistance corresponding to the IC terminal through which current he/she wishes to measure flows. |
申请公布号 |
US2012112737(A1) |
申请公布日期 |
2012.05.10 |
申请号 |
US201113382690 |
申请日期 |
2011.04.19 |
申请人 |
NAKAYAMA TAKESHI;SAITO YOSHIYUKI;ISHII MASAHIRO;ISHINO KOUICHI;ISHIMARU YUKIHIRO |
发明人 |
NAKAYAMA TAKESHI;SAITO YOSHIYUKI;ISHII MASAHIRO;ISHINO KOUICHI;ISHIMARU YUKIHIRO |
分类号 |
G01R1/20 |
主分类号 |
G01R1/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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