APPARATUS FOR TESTING SEMICONDUCTOR CHIPS WITH FLEXIBLE LINKED POWER SUPPLY FUNCTIONALITY

摘要

PURPOSE: A semiconductor chip test system which has a flexible power supply function is provided to be connected to an existing semiconductor chip test system, thereby supplying power required for performing a specific test. CONSTITUTION: A power interlocking control unit(41) receives a power interlocking signal. The power interlocking control unit determines an interlocking power supply process. A power supply board(43) supplies power through an interlocking power supply process with a main test apparatus according to the determination of the power interlocking control unit.