发明名称 LOW COST FABRICATION OF DOUBLE BOX BACK GATE SILICON-ON-INSULATOR WAFERS WITH SUBSEQUENT SELF ALIGNED SHALLOW TRENCH ISOLATION
摘要 A semiconductor substrate structure for manufacturing integrated circuit devices includes a bulk substrate; a lower insulating layer formed on the bulk substrate, the lower insulating layer formed from a pair of separate insulation layers having a bonding interface therebetween; an electrically conductive layer formed on the lower insulating layer; an insulator with etch stop characteristics formed on the electrically conductive layer; an upper insulating layer formed on the etch stop layer; and a semiconductor layer formed on the upper insulating layer. A scheme of subsequently building a dual-depth shallow trench isolation with the deeper STI in the back gate layer self-aligned to the shallower STI in the active region in such a semiconductor substrate is also disclosed.
申请公布号 US2012112309(A1) 申请公布日期 2012.05.10
申请号 US201213350889 申请日期 2012.01.16
申请人 DENNARD ROBERT H.;GREENBERG DAVID R.;MAJUMDAR AMLAN;SHI LEATHEN;YAU JENG-BANG;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DENNARD ROBERT H.;GREENBERG DAVID R.;MAJUMDAR AMLAN;SHI LEATHEN;YAU JENG-BANG
分类号 H01L27/12;H01L21/762 主分类号 H01L27/12
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