| 摘要 |
Detecting a defect on a storage device is disclosed. Detecting includes receiving a signal read from a storage device, sampling the signal to obtain a set of signal samples, wherein the sampling starts at an arbitrary time, computing a defect value for a defect type using the set of signal samples, comparing the defect value with a threshold associated with the defect type, determining whether there is a defect of the defect type based at least in part on the comparison, and in the event that a defect is detected, outputting an indication associated with the defect. |
