| 摘要 |
<p>The application describes a system and method for configuring an area (51, 53) of a reconfigurable array of logic units (51-1,53-1) in order to constrain signal propagation during testing using an Automatic Test Pattern Generation Tool. The method comprises applying a predetermined blocking mask (TSF: 51-4, 53-4) comprising configuration data for controlling signal propagation between a group of logic units (51-1 to 53-1) in the array (51, 53) and testing the portion of the array (51, 53) to which the blocking mask (2bits in TSF: 51-4, 53-4) has been applied.</p> |
