| 摘要 |
<p>The method involves measuring a value of parameter e.g. signal-to-noise ratio, of electrical circuit (100) for a set of connection configurations. One of the configurations is selected among the configurations, for which the value corresponds to a case where a mismatch between values of characteristic quantities of a pair of functional blocks formed by electrical resistors (102a-102d, 104a-104d) and connecting units i.e. switches (106a-106d, 108a-108d, 110a-110d) is small. One of the connecting units is positioned according to the selected connection configuration. Independent claims are also included for the following: (1) a method for manufacturing an electrical circuit (2) a device for configuring an electrical circuit, comprising a set of electrical elements.</p> |
