发明名称 SUBSTRATE PROCESSING METHOD
摘要 There is provided a substrate processing method, in which a throughput can be improved even in case the time for recovery processing for restoring the state of a processing chamber is longer than the time for predetermined processing to be performed in the processing chamber. Substrates are alternately transferred to two processing chambers C, D, and the same film forming processing is performed on the substrates in the processing chambers C, D in parallel with each other. When the number of substrates processed in the processing chamber C has reached a predetermined number (11 substrates), dummy sputtering processing in the film forming chamber C is started and also 23rd-25th substrates of the first lot are transferred to the film forming chamber D to thereby perform film forming processing until the dummy sputtering processing is finished.
申请公布号 KR20120046223(A) 申请公布日期 2012.05.09
申请号 KR20127003026 申请日期 2010.07.15
申请人 ULVAC, INC. 发明人 NAKAMURA SHINYA;FUJII YOSHINORI;NAGASHIMA HIDETO
分类号 H01L21/677;C23C14/56;H01L21/203 主分类号 H01L21/677
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