发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING TANTALUM BASE NITRIDE
摘要 PURPOSE: A semiconductor device manufacturing method which uses a tantalum nitride film is provided to arrange the tantalum nitride film which has low resistivity by controlling nitrogen content of the tantalum nitride film while nitrifying a tantalum film. CONSTITUTION: A capacitor is comprised of a lower electrode, a dielectric layer, and an upper electrode. The lower electrode or the upper electrode includes a tantalum nitride film(104). A tantalum film is deposited using an atomic layer deposition method. The tantalum film is exposed to a nitrogen-containing gas.
申请公布号 KR20120045408(A) 申请公布日期 2012.05.09
申请号 KR20100106925 申请日期 2010.10.29
申请人 SK HYNIX INC. 发明人 AHN, JI HOON;LEE, KEE JEUNG;DO, KWAN WOO;PARK, KYUNG WOONG;BAEK, KUN HOON
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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