发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING TANTALUM BASE NITRIDE |
摘要 |
PURPOSE: A semiconductor device manufacturing method which uses a tantalum nitride film is provided to arrange the tantalum nitride film which has low resistivity by controlling nitrogen content of the tantalum nitride film while nitrifying a tantalum film. CONSTITUTION: A capacitor is comprised of a lower electrode, a dielectric layer, and an upper electrode. The lower electrode or the upper electrode includes a tantalum nitride film(104). A tantalum film is deposited using an atomic layer deposition method. The tantalum film is exposed to a nitrogen-containing gas.
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申请公布号 |
KR20120045408(A) |
申请公布日期 |
2012.05.09 |
申请号 |
KR20100106925 |
申请日期 |
2010.10.29 |
申请人 |
SK HYNIX INC. |
发明人 |
AHN, JI HOON;LEE, KEE JEUNG;DO, KWAN WOO;PARK, KYUNG WOONG;BAEK, KUN HOON |
分类号 |
H01L21/8242;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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